The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Jun. 28, 2004
Andreas Erlbacher, Abtenau, AT;
Lutz Niggl, Salzburg, AT;
Alois Krutzenbichler, Erlstätt, DE;
Tecan Trading AG, Männedorf, CH;
Abstract
The present invention relates to a device () and a method for determining parameters of fluid-containing samples () in a system () for individually irradiating the samples () with light () of a light source () in an essentially vertical irradiation direction (). In this case, this system () includes a detector () for measuring the light () coming from a single sample, and this detector () has a detection direction ('), which lies on an optical axis () that is essentially parallel to the optical axis () of the light source (). This device () includes at least one reflective surface (), using which the light () coming essentially vertically out of the light source () may be at least partially deflected in an essentially horizontal irradiation direction (). The device according to the present invention and the method according to the present invention are distinguished in that the detection direction (′) of the detector ()—for measuring the individual light () coming from a single sample ()—is positioned at an angle to the optical axis of the light () irradiating the sample () in such a way that only the light () coming from the individual sample (), but not this light (), reaches the detector ().