The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Jul. 16, 2002
Gregor Cedilnik, Gaeufelden, DE;
Gregor Cedilnik, Gaeufelden, DE;
Agilent Technologies, Inc., Paol Alto, CA (US);
Abstract
Determining a measuring uncertainty and/or maximum measuring error of a polarization dependent loss—PDL—tester for determining a PDL value of a device under test—DUT—is provided by using the PDL tester for determining a value of PDL of a verification element having an actual value of PDL greater than a maximum value of a specified measuring range, wherein the PDL tester has an expected measuring uncertainty and/or expected maximum measuring error. The measuring uncertainty and/or maximum measuring error or the tester is then derived from the determined value of PDL of the verification element in conjunction with the actual value of PDL of the verification element.