The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Apr. 29, 2004
Patricia A. Beck, Palo Alto, CA (US);
Patricia A. Beck, Palo Alto, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
An apparatus for transverse characterization of materials includes a lower pattern of contacts, separated by spacings, a material, and an upper pattern of a multiplicity of contacts, separated by spacings differing from the spacings of the lower pattern. The transverse characterization method includes receiving lower pattern of a multiplicity of contacts, separated by spacings along a surface, with a material above the surface, successively placing an upper contact near the upper surface of the material in an upper pattern of locations separated by spacings differing from the spacings of the lower pattern, measuring the characteristics between the upper contact and one or more contacts of the lower pattern and evaluating the measured characteristics to previous measurements, wherein the evaluation provides the transverse characterization.