The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2007

Filed:

Dec. 14, 2004
Applicants:

Saishi Fujikawa, Kanagawa, JP;

Etsuko Asano, Kanagawa, JP;

Tatsuya Arao, Yamanashi, JP;

Takashi Yokoshima, Kanagawa, JP;

Takuya Matsuo, Osaka, JP;

Hidehito Kitakado, Nara, JP;

Inventors:

Saishi Fujikawa, Kanagawa, JP;

Etsuko Asano, Kanagawa, JP;

Tatsuya Arao, Yamanashi, JP;

Takashi Yokoshima, Kanagawa, JP;

Takuya Matsuo, Osaka, JP;

Hidehito Kitakado, Nara, JP;

Assignees:

Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;

Sharp Kabushiki Kaisha Co., Ltd., Osakai-shi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/4763 (2006.01); H01L 21/3205 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device of which manufacturing steps can be simplified by doping impurities at a time, and a manufacturing method thereof. The manufacturing method of the semiconductor device comprises the steps of: forming first and second semiconductor layers over a substrate, forming a first insulating film over the first and second semiconductor layers, forming first and second conductive films thereover, forming a first gate electrode having a stacked layer of the first and second conductive films, in which a portion of the first conductive film is exposed from the second conductive film, over the first semiconductor layer with the first insulating film interposed therebetween, forming a second insulating film over the first insulating film, forming third and fourth conductive films thereover, and forming a second gate electrode having a stacked layer of the third and fourth conductive films, in which a portion of the third conductive film is exposed from the fourth conductive film, over the second semiconductor layer with the first and second insulating films interposed therebetween.


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