The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2007

Filed:

Dec. 09, 2003
Applicants:

Akihito Kamei, Yawata, JP;

Tatsurou Kawamura, Kyotanabe, JP;

Keiko Yugawa, Nara, JP;

Inventors:

Akihito Kamei, Yawata, JP;

Tatsurou Kawamura, Kyotanabe, JP;

Keiko Yugawa, Nara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 33/536 (2006.01); G01N 21/00 (2006.01); C07K 16/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an immunoreaction measuring method for measuring an antigen or antibody contained as a subject substance in a sample, wherein the sample was mixed with at least one compound selected from the group consisting of dicarboxylic acids having a hydroxyl group, dicarboxylic acids having a double bond, straight-chain dicarboxylic acids expressed by the chemical formula (1): HOOC(CH)COOH (n is an integer), and the salts of these dicarboxylic acids, and an antibody or antigen as a specifically binding substance capable of specifically binding to the subject substance, to obtain an acidic reaction solution, and then an antigen-antibody complex, generated by an antigen-antibody reaction of the subject substance with the specifically binding substance in the reaction solution was detected. This makes it possible to improve a measurement value and to relax a limitation of a measurement range due to a zone phenomenon that occurs in an antigen-excess region.


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