The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2007

Filed:

Jun. 29, 2001
Applicants:

Bi-yu LI, San Diego, CA (US);

Xun Wang, San Diego, CA (US);

Liang Shi, San Diego, CA (US);

Inventors:

Bi-Yu Li, San Diego, CA (US);

Xun Wang, San Diego, CA (US);

Liang Shi, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01); C07H 19/00 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a new method for sequence-specific identification, separation and quantitative measurement of nucleic acid fragments. The invention is based on the use of restriction endonucleases that have degenerate bases in their recognition or cleavage sequence. The method has broad applications, including DNA fingerprinting, differential display of mRNA, mutation and polymorphism identification, diagnosis and drug screening.


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