The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Jan. 22, 2003
Gerhard Vollmar, Meckenheim, DE;
Zaijun HU, Ludwigshafen, DE;
Jari Kallela, Espoo, FI;
Manuel Greulich, Oberwolfach, DE;
Gerhard Vollmar, Meckenheim, DE;
Zaijun Hu, Ludwigshafen, DE;
Jari Kallela, Espoo, FI;
Manuel Greulich, Oberwolfach, DE;
ABB Research Ltd, Zürich, CH;
Abstract
A system and method for supporting a fault cause analysis in a afault event in a plant includes a data processor with memory storing a fault model of XML files accessed by a fault cause navigator and an operating/display device. Each fault model contains an industry-specific process model divided into process steps, with steps and defined fault events needed therefor assigned to plant components/systems, and fault trees assigned to fault events and having fault hypotheses. A checklist with symptoms for verification of the fault hypothesis is assigned to the fault hypotheses. The system enables navigation to the relevant step in the process model by the display and navigator, and presents a fault event list. Following fault event selection, critical components/systems corresponding thereto are found and displayed. Possible symptoms are generated and displayed in a checklist and hypotheses of possible fault causes, contained in the fault trees, are found and displayed.