The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Apr. 29, 2003
José Antonio Lázaro Villa, Stuttgart, DE;
Johannes Koppenborg, Sersheim, DE;
Rudolf Wessel, Stuttgart, DE;
José Antonio Lázaro Villa, Stuttgart, DE;
Johannes Koppenborg, Sersheim, DE;
Rudolf Wessel, Stuttgart, DE;
Avanex Corporation, Fremont, CA (US);
Abstract
A new method for characterizing the amplitude and phase distributions of the light propagating through arrayed-waveguide gratings is presented. The new method is based on the IFT. A very good agreement of the results obtained from the IFT method in comparison with OLC method has been achieved. The new method has been applied to an AWG with a small ΔL of 22 μm where the other methods fail. The precision of this measurement is demonstrated by a good agreement between the transmittance obtained from direct measurement and from calculation using the amplitude and phase distributions. Finally we want to point out, that although the results are based on a FTS measurement, the method can be applied to any experimental technique that provides a measurement of the complex transmittance of the AWG.