The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Sep. 06, 2005
Eran Davidov, Sunnyvale, CA (US);
Michael J. Parks, Union City, CA (US);
Jamie D. Riggs, Longmont, CO (US);
David C. Gurchinoff, San Jose, CA (US);
Terrence Barr, Freiberg, DE;
Eran Davidov, Sunnyvale, CA (US);
Michael J. Parks, Union City, CA (US);
Jamie D. Riggs, Longmont, CO (US);
David C. Gurchinoff, San Jose, CA (US);
Terrence Barr, Freiberg, DE;
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A test apparatus including a data interface configured to couple with at least one of a test device and a baseline device, and a computing device configured to perform a method including performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline devices, performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device, and using a heuristic including a number of tests to determine whether the test device has an acceptable level of performance relative to the baseline device.