The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2007

Filed:

Sep. 06, 2005
Applicants:

Eran Davidov, Sunnyvale, CA (US);

Michael J. Parks, Union City, CA (US);

Jamie D. Riggs, Longmont, CO (US);

David C. Gurchinoff, San Jose, CA (US);

Terrence Barr, Freiberg, DE;

Inventors:

Eran Davidov, Sunnyvale, CA (US);

Michael J. Parks, Union City, CA (US);

Jamie D. Riggs, Longmont, CO (US);

David C. Gurchinoff, San Jose, CA (US);

Terrence Barr, Freiberg, DE;

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for evaluating portable electronic devices includes performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline device. The method further includes performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device. Finally, the test device is determined to be initially acceptable if the total amount of work performed by the test device and the total amount of work performed by the baseline device differ by less than an acceptance threshold, and is determined to be finally acceptable by performing a quotient test on the data.


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