The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Jun. 19, 2002
Ippei Shake, Yokohama, JP;
Hidehiko Takara, Yokosuka, JP;
Kentaro Uchiyama, Yokosuka, JP;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
A monitoring system includes first and second evaluation sections for obtaining an averaged Q-factor parameter and a waveform distortion parameter from an optical signal amplitude histogram collected from optical signals under measurement. The monitoring system further includes a third evaluation section for determining both averaged Q-factor parameter and waveform distortion parameter, and for making a decision as to whether the main factor of the optical signal quality degradation is waveform distortion or not by comparing the averaged Q-factor parameter and waveform distortion parameter with their initial values or initial characteristics which are obtained when no optical signal quality degradation is present.