The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Sep. 17, 2004
Xing LI, Webster, NY (US);
Terri A. Clingerman, Palmyra, NY (US);
Xing Li, Webster, NY (US);
Terri A. Clingerman, Palmyra, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
Detecting skew and determining skew angle using the front of a document by determining background-to-document transitions. Incoming scanlines are interval sampled in the fast scan direction every nth pixel. The samples are collected and organized into a two dimension array comprised of scanline based rows and interval based columns. The collected and organized samples are analyzed by intervals to determine a scanline (row) where a specified sampling condition exceeds predetermined threshold. The corresponding row-interval point forms a background-to-medium transition point of the edge of a document. When two or more background-to-medium transition points are found from different intervals the skew angle can be determined using linear regression.