The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Sep. 03, 2002
Applicants:
Melvin J. Laurila, Georgetown, KY (US);
Claus C. Bachmann, Bad Wilbad, DE;
Inventors:
Melvin J. Laurila, Georgetown, KY (US);
Claus C. Bachmann, Bad Wilbad, DE;
Assignee:
Quality Control, Inc., Georgetown, KY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21N 23/223 (2006.01);
U.S. Cl.
CPC ...
Abstract
An X-ray fluorescence measuring system and related measuring methods are disclosed, the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The energy fluoresced may be detected () and used to measure the elemental composition of the material, including trace elements. The material may be moving or stationary.