The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Jul. 12, 2002
Lisa Ann Desandoli, Coquitlam, CA;
Jurgen Hissen, Port Moody, CA;
Kenneth William Ferguson, Burnaby, CA;
Gershom Birk, Coquitlam, CA;
Lisa Ann Desandoli, Coquitlam, CA;
Jurgen Hissen, Port Moody, CA;
Kenneth William Ferguson, Burnaby, CA;
Gershom Birk, Coquitlam, CA;
PMC-Sierra, Inc., Santa Clara, CA (US);
Abstract
A loopback circuit for testing low and high frequency operation of integrated circuit transmitter and receiver components. First and second resistors forming a first branch of the circuit are series-connected between first and second circuit ports. Third and fourth resistors forming a second branch of the circuit are series-connected between third and fourth circuit ports. A DC isolator is connected between the first and second branches. At lower frequencies, the two branches are DC-isolated, enabling ATE-measurement of the transmitter's output drive level independently of the receiver, continuity testing of ESD protection structures, etc. At higher frequencies, the transmitter's output signal is split into three portions, each of which is attenuated by a selected amount. One of the attenuated signal portions is applied to the receiver to test the receiver's sensitivity, independently of possible excess resiliency in the transmitter's output drive level.