The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Mar. 21, 2006
Ludger Martinschledde, Rietberg-Bokel, DE;
Guenter Herrmann, Guetersloh, DE;
Juergen Eckstein, Versmold, DE;
Michael Krauhausen, Aachen, DE;
Ludger Martinschledde, Rietberg-Bokel, DE;
Guenter Herrmann, Guetersloh, DE;
Juergen Eckstein, Versmold, DE;
Michael Krauhausen, Aachen, DE;
Claas Fertigungstechnik GmbH, Beelen, DE;
Abstract
An arrangement for measuring components has a manipulator, at least one measuring system in operative connection with the manipulator, the at least one measuring system including at least one contour measuring device associated with the manipulator and generating an optical sensing surface sweeping a measuring region, an at least one measuring object arranged in the measuring region and at least one reference feature associated with the measuring object; and a method of measurements is performed with the arrangement.