The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Jul. 22, 2005
Michael R. Kehoe, Bozeman, MT (US);
Casey W. Smith, Bozeman, MT (US);
Rand C. Swanson, Bozeman, MT (US);
Michael R. Kehoe, Bozeman, MT (US);
Casey W. Smith, Bozeman, MT (US);
Rand C. Swanson, Bozeman, MT (US);
Resonon Inc., Bozeman, MT (US);
Abstract
A scalable imaging spectrometer, using anamorphic optical elements to form an intermediate focus in only one dimension. Light reflects off an object to form an incident beam. The beam reflects off an anamorphic objective mirror to form a line focus at a slit. At the slit, the beam is focused along the spectral dimension, but remains substantially collimated along the spatial dimension. The beam is then recollimated in the spectral dimension by a second anamorphic mirror, reflects off a diffraction grating, passes through a lens, and is brought to focus on a two dimensional detector, which produces both spectral and spatial information about the object. Because there is no intermediate focus in the spatial dimension, there are no off-axis aberrations from the anamorphic mirrors, and the field of view may be substantially increased over prior art spectrometers in the spatial dimension.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile