The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2007

Filed:

Jan. 31, 2005
Applicants:

Yasutomo Goto, Fujinomiya, JP;

Shuji Kanayama, Fujinomiya, JP;

Kazuhito Miyake, Fujinomiya, JP;

Inventors:

Yasutomo Goto, Fujinomiya, JP;

Shuji Kanayama, Fujinomiya, JP;

Kazuhito Miyake, Fujinomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 7/00 (2006.01); G01D 15/34 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image recording sheet used in electrophotographic imaging which comprises a paper sheet substrate coated with an image recording layer that takes on a probe penetration depth of 0.33 μm or greater for a change in prove temperature from 50° to 150° C. when measuring the probe penetration depth on a scanning type thermal microscope having a thermal probe operative as both heater and position sensor that is made of a Pt alloy containing 10% of Rh and has a cantilever spring constant of 1 N/m, a diameter of 6 μm and a curvature radius of 5 μm at an extreme end thereof under a condition that the thermal prove is changed in temperature at a programming rate of 15° C./sec within a programmed range of from a room temperature to 200° C. under a load (weight)+20 nA in 4-split T-B (Top-Bottom) value.


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