The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2007

Filed:

May. 20, 2003
Applicants:

Byong Mok OH, Newton, MA (US);

Fredo Durand, Boston, MA (US);

Max Chen, San Francisco, CA (US);

Inventors:

Byong Mok Oh, Newton, MA (US);

Fredo Durand, Boston, MA (US);

Max Chen, San Francisco, CA (US);

Assignee:

Mok3, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a variety of tools and techniques for adding depth information to photographic images, and for editing and manipulating images that include depth information. The tools for working with such images include tools for 'painting' in a depth channel, for using geometric primitives and other three-dimensional shapes to define depth in a two-dimensional image, and tools for 'clone brushing' portions of an image with depth information while taking the depth information and lighting into account when copying from one portion of the image to another. The tools also include relighting tools that separate illumination information from texture information.


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