The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2007

Filed:

Mar. 28, 2003
Applicants:

Ho-san Han, Seoul, KR;

Hye-joung Park, Seoul, KR;

Tai-kyong Song, Seoul, KR;

Inventors:

Ho-San Han, Seoul, KR;

Hye-Joung Park, Seoul, KR;

Tai-Kyong Song, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Dynamic focusing is performed at Nyquist rate Ffor the received signal. For each imaging point, a single-bit SDM sample is selected from each active array channel, according to the corresponding focusing delay. A block of data, centered at the selected SDM sample, is defined for each channel. Next, bit-wise block addition is performed to obtain the sum of all the blocks. The block addition output is fed to the demodulation filter. K(=┌L/M┐) demodulation filters are used. In another approach, the demodulation filters are placed just behind sigma-delta modulators. In each channel, K filters produce successively the demodulated signals for K consecutive imaging points. By taking the sum of samples retrieved from the same memory locations, dynamic focusing is achieved. Since each demodulation filter takes a single-bit SDM sequence as an input data, a simple accumulator calculates the sum of filter coefficients to be multiplied by input samples.


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