The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
May. 02, 2006
David Lee Wooton, Beaverdam, VA (US);
Richard Walter Hirthe, Milwaukee, WI (US);
Martin Arthur Seitz, Brookfield, WI (US);
David Lee Wooton, Beaverdam, VA (US);
Richard Walter Hirthe, Milwaukee, WI (US);
Martin Arthur Seitz, Brookfield, WI (US);
Eaton Corporation, Cleveland, OH (US);
Abstract
A system and method for monitoring and controlling the properties of fluids is disclosed. The inventive concept employs impedance spectroscopy (IS) measurements, and is suitable for real-time, in situ, monitoring and quality control operations, such as quality control during the manufacture of blended lubricants. IS data are obtained for three or more frequencies, where the lowest frequency is less than 1 Hz and the highest frequency is greater than 1 Hz. These data may be interpreted according to statistical techniques such as Principal Component Regression, analytical techniques such as equivalent circuit modeling, or by a combination thereof. The data analysis provides characteristics, or IS signatures, relating to the properties of the fluid. IS signatures for a test fluid are compared to IS signatures for calibration fluids to determine whether the properties of the test fluid fall within specified limits. Quality control adjustments to the test fluid properties may be performed based on the IS signatures.