The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2007
Filed:
Mar. 19, 2001
Katsuhiko Machida, Tokyo, JP;
Sadayori Hoshina, Tokyo, JP;
Takashi Ushida, Ibaraki, JP;
Junichiro Arai, Ibaraki, JP;
Hideo Katayama, Ibaraki, JP;
Chiaki Okumura, Ibaraki, JP;
Yoshihisa Amano, Ibaraki, JP;
Katsuhiko Machida, Tokyo, JP;
Sadayori Hoshina, Tokyo, JP;
Takashi Ushida, Ibaraki, JP;
Junichiro Arai, Ibaraki, JP;
Hideo Katayama, Ibaraki, JP;
Chiaki Okumura, Ibaraki, JP;
Yoshihisa Amano, Ibaraki, JP;
Abstract
Disclosed herein is a method for determining the drug sensitivity of a microbe which comprises pouring a microbial suspension into each of the compartments or wells at a position which is in the vicinity of an electrode for measuring dissolved oxygen concentration, measuring current from each electrode at a second time interval for a third time period, each time is obtained based upon each of the measured currents at which the maximum current is obtained, obtaining each current value within a fourth time period which starts from the time at which the maximum current is obtained, detecting drug sensitivity based upon the variation condition of each current value during the fourth time period. The method allows rapid drug susceptibility measurements.