The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2007

Filed:

Apr. 26, 2005
Applicants:

Keita Okuyama, Hitachi, JP;

Kenji Noshita, Hitachi, JP;

Akira Sasahira, Hitachi, JP;

Inventors:

Keita Okuyama, Hitachi, JP;

Kenji Noshita, Hitachi, JP;

Akira Sasahira, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 49/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A subterranean environment evaluating apparatus and method, which measure, e.g., the geologic distribution coefficient in a subterranean environments using, e.g., a pit formed by boring. The subterranean environment evaluating apparatus comprises a geologic evaluation sensor, a pump, an analyzer, a PC, a data transmitter, etc., and it is disposed in the pit formed underground by boring. The geologic evaluation sensor is disposed to form a thin layer channel defined by the surface of a rock bed. Groundwater mixed with a tracer is caused to flow through the sensor, and the analyzer measures a change of tracer concentration in the groundwater between before and after contact of the groundwater with the rock bed. The PC determines a breakthrough curve from the change of tracer concentration, thereby calculating the distribution coefficient (Kd) between the rock bed and the groundwater and the effective diffusion coefficient of the rock bed.


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