The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2007
Filed:
Jul. 22, 2003
Applicants:
Burton Akira Hipp, Mountain View, CA (US);
Carlos Wong, Mountain View, CA (US);
Yuh-yen Yeh, Mountain View, CA (US);
Inventors:
Burton Akira Hipp, Mountain View, CA (US);
Carlos Wong, Mountain View, CA (US);
Yuh-Yen Yeh, Mountain View, CA (US);
Assignee:
VERITAS Operating Corporation, Cupertino, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
An overlay filesystem is described. The overlay filesystem is capable of accessing files from a first layer or a second layer based on one or more criteria. The overlay filesystem is also capable of saving changes made to any files in a different layer while preserving the original files in the original layer.