The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2007
Filed:
Feb. 28, 2003
Michael Edward Farmer, West Bloomfield, MI (US);
Michael Edward Farmer, West Bloomfield, MI (US);
Eaton Corporation, Cleveland, OH (US);
Abstract
A system or method (collectively 'selection system') is disclosed for selecting attributes for a classifier in a sensor system. The selection system selects attribute types using statistical distributions of the attribute values associated with those attribute types. Attribute types not within the selectively identified subset of attribute types can be filtered out before such data is sent to a classifier. The system can use a test data subsystem for storing and accessing actual sensor data. A distribution analysis subsystem can perform statistical analyses on the test data to identify underlying distributions, and to compare individual attribute types to such distributions. An attribute selection subsystem, wherein said attribute selection subsystem selectively identifies a subset of attribute types from said subset of attribute types.