The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2007

Filed:

Dec. 23, 2004
Applicants:

Tsuneo Katsuyama, Kawasaki, JP;

Masanobu Morinaga, Kawasaki, JP;

Hideaki Miyazaki, Kawasaki, JP;

Yuji Nomura, Kawasaki, JP;

Takeshi Yasuie, Kawasaki, JP;

Noriyuki Fukuyama, Kawasaki, JP;

Masaaki Wakamoto, Kawasaki, JP;

Satoshi Nojima, Kawasaki, JP;

Inventors:

Tsuneo Katsuyama, Kawasaki, JP;

Masanobu Morinaga, Kawasaki, JP;

Hideaki Miyazaki, Kawasaki, JP;

Yuji Nomura, Kawasaki, JP;

Takeshi Yasuie, Kawasaki, JP;

Noriyuki Fukuyama, Kawasaki, JP;

Masaaki Wakamoto, Kawasaki, JP;

Satoshi Nojima, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-readable recording medium recording a program capable of accurately analyzing the cause of a performance fault at the very end point of a client system, server system, etc. Outgoing and incoming packets are captured during execution of a communication application to measure a round trip time, and a communication window size of the transmitting source is estimated based on the captured incoming packets. A throughput estimate is calculated from the round trip time and the communication window size, and the estimated value and actual measured value of the throughput are displayed on, for example, a display, together with various other communication parameters including the communication window size and the round trip time, whereby the cause of a performance fault can be accurately located by quantitative analysis.


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