The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2007

Filed:

Sep. 10, 2001
Applicants:

Ron J. Kadlec, Longmont, CO (US);

Christopher J. Turner, Niwot, CO (US);

Charles R. Watt, Longmont, CO (US);

Hans B. Wach, Longmont, CO (US);

Inventors:

Ron J. Kadlec, Longmont, CO (US);

Christopher J. Turner, Niwot, CO (US);

Charles R. Watt, Longmont, CO (US);

Hans B. Wach, Longmont, CO (US);

Assignee:

DPHI Acquisitions, Inc., Boulder, CO (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of storing calibrated optical parameters is presented. In some embodiments, calibrated optical parameters are stored in place of stored parameters. In some embodiments, averages between the calibrated operating parameters and stored optical parameters are stored. In other embodiments, the stored optical parameters are allowed to vary only by a maximum amount. In some embodiments, if the calibrated parameters vary by more than threshold values, then the calibrated parameters are not stored.


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