The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2007
Filed:
Oct. 15, 2003
Bernard Drevillon, Clamart, FR;
Antonello DE Martino, Montrouge, FR;
Bernard Drevillon, Clamart, FR;
Antonello De Martino, Montrouge, FR;
Centre National de la Recherche Scientifique (CNRS), Paris Cedex, FR;
Ecole Polytechnique, Palaiseau Cedex, FR;
Abstract
A liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process intended for measuring the representative parameters of a sample in which the polarimetric system contains an excitation section emitting a light beam that passes through a polarization state generator (PSG) and onto a sample. After reflection or transmission by the sample, the beam goes through an analysis section with a polarization state detector (PSD). The PSG and PSD each have a first and a second liquid crystal elements LC(j=1,2) having, for each LCelement of the PSG (respectively for each LCelement of the PSD), an extraordinary axis making an angle θ(resp. θ') with respect to the polarization direction (i), and a retardation δ(resp (δ′) between its ordinary and extraordinary axes, the liquid crystals LCelements being positioned in reverse order in the PSD with respect to the LCelements of the PSG.