The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2007

Filed:

May. 11, 1999
Applicants:

Akio Saigusa, Utsunomiya, JP;

Hitoshi Inoue, Yokohama, JP;

Inventors:

Akio Saigusa, Utsunomiya, JP;

Hitoshi Inoue, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an X-ray film image reading apparatus, dark output distribution data of a CCD line sensor is corrected by using correction data. In order to suppress the influence of random noises on the correction data, a dark distribution correction data calculation circuitcalculates an average value or mode value of dark distribution outputs of all or some pixels of a CCD line sensor or a dark distribution output of the CCD line sensor subjected to a spatial low-pass filtering process, and stores it in a dark distribution memory as correction data. Next, a light source is turned on, and a subtractor subtracts the stored correction data from an output of the line sensor read from an X-ray film while the light source is turned on.


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