The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2007
Filed:
Sep. 21, 2004
Karsten Saendig, Palling, DE;
Karsten Saendig, Palling, DE;
Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A position-measuring device for generating a measuring signal includes a track, which has an incremental graduation having a specified graduation period that extends along a measuring direction, having at least one discontinuity of the incremental graduation at a reference position for generating a reference signal and having a scanning unit movable relative to the track along the measuring direction, for scanning the incremental graduation, the at least one discontinuity formed by a modification of a transverse substructure of the incremental graduation that extends perpendicular to the measuring direction, and that deflects radiation beams originating from the scanning unit. The deflection direction at the discontinuity deviates from the deflection direction in other regions of the incremental graduation. The scanning unit includes at least two reference-pulse detectors provided for receiving radiation beams having a different deflection direction. Upstream of the reference-pulse detectors, at least one imaging optics system is arranged in the beam path of the respective deflected radiation beam.