The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2007

Filed:

Jan. 07, 2005
Applicants:

Thomas W. Nenno, Murrysville, PA (US);

Patrick M. Minogue, Pittsburgh, PA (US);

Rick D. Rishel, Monroeville, PA (US);

Inventors:

Thomas W. Nenno, Murrysville, PA (US);

Patrick M. Minogue, Pittsburgh, PA (US);

Rick D. Rishel, Monroeville, PA (US);

Assignee:

Westinghouse Electric Co. LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic testing assembly structured to examine a test object, wherein the test object has a surface, and the examination examines the structure of the test object under the surface as well as the profile of the surface. The ultrasonic testing assembly includes a sled assembly structured to support a plurality of ultrasonic transducers, the sled assembly including at least one support member having a lower surface, at least one surface ultrasonic transducer coupled to the sled assembly and structured to extend below the support member lower surface and further structured to engage the test object surface, the surface ultrasonic transducer structured to examine internal structure of the test object and provide a first output, at least one profiling device coupled to the sled assembly, the profiling device structured to measure the profile of the test object surface and provide a second output, and a control device structured to correlate the first output and the second output and to calculate a corrected output.


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