The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2007
Filed:
Sep. 15, 2004
Makoto Kaneko, Higashihiroshima, JP;
Shinji Tanaka, Hiroshima, JP;
Tomohiro Kawahara, Higashihiroshima, JP;
Shinji Takeuchi, Saitama, JP;
Makoto Kaneko, Higashihiroshima, JP;
Shinji Tanaka, Hiroshima, JP;
Tomohiro Kawahara, Higashihiroshima, JP;
Shinji Takeuchi, Saitama, JP;
Makoto Kaneko and Tomohiro Kawahara, Higashihiroshima, JP;
Fujinon Corporation, Saitama, JP;
Shinji Tanaka, Hiroshima, JP;
Abstract
It is possible to blast air on a surface portion of a measured object from a hole of pressing means, project illumination light in a concentric pattern with an optical element and shoot the measured object with a CCD so as to visually grasp hardness distribution on the surface portion from distortion of the concentric pattern displayed on an observed image. As for the hardness distribution, it is possible to detect luminance distribution of a measured object image obtained by the CCD so as to display the concentric pattern which is the luminance distribution as a conspicuous representation of the hardness distribution. And the luminance distribution can also be represented in the concentric pattern by multiplying a luminance value by an overflowing coefficient.