The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Feb. 25, 2005
Daniel Görsch, Dresden, DE;
Andreas Lotze, Dresden, DE;
Daniel Görsch, Dresden, DE;
Andreas Lotze, Dresden, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for measuring a workpiece includes the steps: measuring measurement points on the surface of a workpiece using a measuring device; evaluating the measured measurement points in such a manner that a predetermined desired geometry of the workpiece to be measured and an actual geometry defined by the measured measurement points are mapped one on top of the other with the aid of a fitting method. In order to be able to adapt or fit the predetermined desired geometry of the workpiece to a measured workpiece, which had been altered, the application of a fitting method is suggested. In this method, transformation parameters are additionally provided for the fitting. These parameters permit a defined transformation of the desired geometry or of the actual geometry with regard to a targeted change of shape of the desired geometry or of the actual geometry.