The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Jan. 14, 2005
Kristian Merkel, Bozeman, MT (US);
William R. Babbitt, Bozeman, MT (US);
Kristian Merkel, Bozeman, MT (US);
William R. Babbitt, Bozeman, MT (US);
Montana State University, Bozeman, MT (US);
Abstract
Techniques for reading the spectral content of a spatial-spectral grating in an inhomogeneously broadened transition (IBT) material include directing multiple probe waveforms to probe a spatial mode of the IBT material. Each probe waveform is a linear frequency modulated chirp; each probe waveform partially overlaps in frequency with a different probe waveform; and multiple output signals are detected from the IBT material in response. Based on the multiple output signals, a readout signal is determined that represents a complete or nearly complete temporal map of the spectral content of the spatial-spectral grating. Calibration of the frequency content can be achieved by simultaneously reading out calibration spectral features. These techniques allow high-bandwidth spectral content to be read with segmented narrow bandwidth chirp probe waveforms and low-bandwidth high-dynamic-range detectors and digitizers.