The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7193801 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 20, 2007

Filed:

Nov. 18, 2004
Applicants:

Seonki Kim, Allentown, PA (US);

Fan Zhou, Bethlehem, PA (US);

Inventors:

Seonki Kim, Allentown, PA (US);

Fan Zhou, Bethlehem, PA (US);

Assignee:

Agere Systems, Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test pattern generator for generating test patterns for testing a servo circuit of a read/write head system. The pattern generator uses a relatively simple encoding technique to produce test patterns that have peaks with phase characteristics similar or identical to the phase characteristics of peaks of real data patterns, such as real BPS and sync mark patterns, for example, stored on a hard disk. The encoded data patterns are output to servo control logic to test the ability of the servo control logic to detect the patterns.


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Kim, Seonki. (2007). Method and apparatus for testing a servo circuit of a read/write head system (U.S. Patent No. 7193801). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7193801

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