The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2007

Filed:

Oct. 14, 2004
Applicants:

John Phelps Sottery, Hamden, CT (US);

Mark Sekas, Orange, CT (US);

Patricia Alison Lafleur, Shrewsbury, PA (US);

Inventors:

John Phelps Sottery, Hamden, CT (US);

Mark Sekas, Orange, CT (US);

Patricia Alison LaFleur, Shrewsbury, PA (US);

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. Digital data is determined from the captured electromagnetic waves. Based on the digital data, the customer is given certain choices and/or informed of certain personal care product recommendations.


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