The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2007

Filed:

May. 17, 2004
Applicants:

William Rassman, Los Angeles, CA (US);

David Ralin, South Pasadena, CA (US);

Robert A. Lieberman, Torrance, CA (US);

Lothar U. Kempen, Redondo Beach, CA (US);

Herbert Shapiro, Laguna Niguel, CA (US);

Inventors:

William Rassman, Los Angeles, CA (US);

David Ralin, South Pasadena, CA (US);

Robert A. Lieberman, Torrance, CA (US);

Lothar U. Kempen, Redondo Beach, CA (US);

Herbert Shapiro, Laguna Niguel, CA (US);

Assignee:

Maven Technologies, LLC, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging method and apparatus are provided, including a light source emitting a polarized light beam, and an optical assembly including a control layer and/or a light reflection surface. The control layer advantageously allows for control over the properties of a generated evanescent wave to optimize an image of a specimen array within the evanescent wave. The light reflection surface includes coupling means used to couple a receptor/capture agent advantageously allowing for flexible control over receptor specific regions.


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