The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2007

Filed:

Feb. 01, 2005
Applicants:

Akira Ohnishi, Tokyo, JP;

Sumitaka Tachikawa, Atsugi, JP;

Shozo Katsuki, Ube, JP;

Koji Masutani, Tokyo, JP;

Inventors:

Akira Ohnishi, Tokyo, JP;

Sumitaka Tachikawa, Atsugi, JP;

Shozo Katsuki, Ube, JP;

Koji Masutani, Tokyo, JP;

Assignee:

Ube Industries, Ltd., Yamaguchi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a small sized wide wave-range spectroscope with a simple structure which requires a short time to measure light for measurement over a wide wavelength spectrum. The small sized wide wave-range spectroscope has a collimator () for changing light for measurement (L) transmitted through a slit () into collimated light (L), a plurality of diffraction gratings () with different grating constants d supported rotatably around a rotational axis in parallel with the incident slit () and disposed side by side in the direction of the rotational axis in the optical path of the collimated light (L), and a diffracted-light focusing members () for focusing a plurality of diffracted light rays (Lto L) provided by the plurality of diffraction gratings () by which the collimated light (L) is diffracted, each of the diffracted-light focusing members () being provided in association with each of the plurality of diffraction gratings ().


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