The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Jul. 25, 2005
Hsin-yueh Sung, Taoyuan Hsien, TW;
Bing-shien Chung, Taoyuan Hsien, TW;
Wen-chi Lo, Taoyuan Hsien, TW;
Chin-chiang Liao, Taoyuan Hsien, TW;
Miao-shen Liu, Taoyuan Hsien, TW;
Hsin-Yueh Sung, Taoyuan Hsien, TW;
Bing-Shien Chung, Taoyuan Hsien, TW;
Wen-Chi Lo, Taoyuan Hsien, TW;
Chin-Chiang Liao, Taoyuan Hsien, TW;
Miao-Shen Liu, Taoyuan Hsien, TW;
Chroma Ate Inc., , TW;
Abstract
An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.