The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Sep. 02, 2005
Scott C. Mcleod, Oro Valley, AZ (US);
Kenneth W. Gay, Tucson, AZ (US);
Scott C. McLeod, Oro Valley, AZ (US);
Kenneth W. Gay, Tucson, AZ (US);
Standard Microsystems Corporation, Hauppauge, NY (US);
Abstract
In one set of embodiments, a temperature measurement system may include an analog to digital converter (ADC) to produce digital temperature readings according to a difference base-emitter voltage (ΔV) developed across a PN-junction. A clock generating circuit may be configured to provide a sampling clock used by the ADC, which in some embodiments may be a delta-sigma ADC, in performing the conversions. The clock generating circuit may be configured to change the frequency of the sampling clock a specified number of times within each one of the one or more conversion cycles to reduce an error component in the temperature measurement, where the error component is produced by an interfering signal, such as an electromagnetic interference (EMI) signal being coherent with the sampling clock, and/or a noise residing on the voltage supply and also being coherent with the sampling clock.