The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Aug. 10, 2005
Yoshinori Kuroiwa, Kamagaya, JP;
Shinichi Tanaka, Yokohamo, JP;
Yoshinori Kuroiwa, Kamagaya, JP;
Shinichi Tanaka, Yokohamo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
A scanning microscope includes: a light source; an optical system that irradiates light from the light source onto a sample while two-dimensionally scanning the light, and collects light from the sample; a photo-detector that receives the light from the sample which has been collected by the optical system, and converts the light thus received into a brightness signal; an integrating circuit that integrates the brightness signal from the photo-detector for each pixel; and an image forming circuit that forms an image of the sample based upon the brightness signal of each pixel integrated by the integrating circuit. And the integrating circuit includes a plurality of integrators for integrating the brightness signal from the photo-detector and an adder for adding output signals from the plurality of integrators, and integrates the brightness signal while sequentially switching the plurality of integrators for each of a plurality of periods obtained by dividing a period corresponding to a pixel.