The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Oct. 29, 2004
Applicant:
Patrick Ouellette, Lanark, CA;
Inventor:
Patrick Ouellette, Lanark, CA;
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and method for determining, based on a gray scale image, focus of an imaging system. A method of this invention includes the steps of: a) acquiring a gray scale image of a test target, b) binarizing the acquired gray scale image, c) analyzing the binarized acquired image, d) adjusting focus of acquisition optics of the imaging system, and e) repeating steps a) through d) until a substantially maximum number of line pairs of a number of groups of line pairs of the test target is obtained, wherein each group from the number of groups of line pairs has a predetermined spatial frequency.