The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Oct. 18, 2004
Applicants:
Katsuyuki Yagi, Nara, JP;
Hiroshi Kanishi, Osaka, JP;
Yoshikazu Kawagoe, Nara, JP;
Inventors:
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01H 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Certain example embodiments of the present invention provide a method for detecting a substrate crack by simple equipment and steps. A substrate crack inspecting method may include the steps of (1) producing a sound by providing vibration to a substrate, (2) determining a power spectrum by capturing the produced sound and carrying out an acoustic analysis for the captured sound, and (3) judging whether or not a substrate crack exists based on a spectral intensity of a predetermined frequency region.