The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2007
Filed:
Mar. 04, 2005
Applicant:
Randall Jaffe, Benicia, CA (US);
Inventor:
Randall Jaffe, Benicia, CA (US);
Assignee:
BEI Technologies, Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01); G01C 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Inertial measurement system and method in which a base is rotated about an input axis in accordance with a rotation to be measured, rotation about the input axis is sensed with one or more angular rate sensors, fixed bias offset is cancelled by dithering the sensors about an axis perpendicular to their sensing axes to vary the orientation of the sensing axes relative to the base in an oscillatory manner, and signals from the sensors are demodulated at the dithering frequency.