The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

Apr. 09, 2002
Applicants:

Louis L. Hsu, Fishkill, NY (US);

Li-kong Wang, Montvale, NJ (US);

Inventors:

Louis L. Hsu, Fishkill, NY (US);

Li-Kong Wang, Montvale, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing circuit for testing a series of at least three alternating transmitter and receiver links. The testing circuit including a built-in-self-test (BIST.) macro for generating test data and transmitting the test data to a first link of the series of transmitter and receiver links, and for receiving processed test data from a last link of the series of transmitter receiver links; and at least one test transmission line for transmitting test data received by a link of the series of transmitter and receiver links to a next link of the series of transmitter and receiver links, wherein the at least one test transmission line connects the at least three transmitter and receiver links. A method for testing a series of links having at least three alternating transmitter and receiver links of a plurality of transmitter and receiver links in a SerDes core including generating at least one test data signal; transmitting the at least one test data signal sequentially through the transmitter and receiver links of the series of links; receiving the at least one test data signal from a last link of the series of transmitter and receiver links; and checking the at least one test data signal received.


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