The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

Sep. 10, 2002
Applicants:

Konstantin I. Boudnik, Castro Valley, CA (US);

Weiqiang Zhang, San Jose, CA (US);

Alexei Volkov, Mountain View, CA (US);

Inventors:

Konstantin I. Boudnik, Castro Valley, CA (US);

Weiqiang Zhang, San Jose, CA (US);

Alexei Volkov, Mountain View, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An invention is disclosed for providing methods for parsing test results having diverse formats. Test results from executed test suites are identified. Test result formats of the test results are categorized. An order of the test results is tracked. A chain of parsers is assembled from individual parsers such that each individual parser is charged with parsing a particular test result format. Test results are parsed such that the data features that define attributes of the test results are identified where the attributes define pass, fail, and comments associated with the pass or fail.


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