The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

May. 02, 2002
Applicants:

Guy Vachon Laborde, Austin, TX (US);

David Mark Pierce, Austin, TX (US);

Andreas Peter Haub, Aachen, DE;

Stefan Romainczyk, Aachen, DE;

Helmut J. Helpenstein, Aachen, DE;

Inventors:

Guy Vachon Laborde, Austin, TX (US);

David Mark Pierce, Austin, TX (US);

Andreas Peter Haub, Aachen, DE;

Stefan Romainczyk, Aachen, DE;

Helmut J. Helpenstein, Aachen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for storing measurements. Each measurement may include bulk data and attribute data. The bulk data and the attribute data may be stored using different storage mechanisms. In one embodiment, relational database technology may be used to store the attribute data. Relational database technology may facilitate querying or searching on the attribute data. The bulk data may be stored in a database specialized for storing bulk data.


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