The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

Jun. 10, 2003
Applicants:

Jens-peter Seher, Stuttgart, DE;

Gerhard Pross, Weil im Schönbuch, DE;

Inventors:

Jens-Peter Seher, Stuttgart, DE;

Gerhard Pross, Weil im Schönbuch, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an aptitude test system () which includes at least one object () which is provided with a data carrier () on which data associated with the object () is stored, as well as a test device () which includes a reading apparatus () whereby the data of the data carrier () can be transfer-red to a computer (). The data includes aptitude data which characterizes at least one permissible application for the associated object (). The computer () has access to current application data which characterizes a concrete application intended for the relevant object (). For aptitude testing of the relevant object () the computer evaluates the aptitude data thereof and the actual application data. The computer () outputs a release signal when the object () is suitable for the intended application.


Find Patent Forward Citations

Loading…