The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

Dec. 01, 2004
Applicants:

Michelle A. Clifford, Chandler, AZ (US);

Rodrigo L. Borras, Marshalltown, IA (US);

Leticia Gomez, San Diego, CA (US);

Akihiro Ueda, Chandler, AZ (US);

Inventors:

Michelle A. Clifford, Chandler, AZ (US);

Rodrigo L. Borras, Marshalltown, IA (US);

Leticia Gomez, San Diego, CA (US);

Akihiro Ueda, Chandler, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is provided for electronic device fall detection. The system and method provides the ability to reliably detect falls even in the presence of other motion in the electronic device. The fall detection system includes a plurality of accelerometers and a processor. The plurality of accelerometers provides acceleration measurements to the processor, with these measurements describing the current acceleration of the electronic device in all directions. The processor receives the acceleration measurements and compares the acceleration measurements to a value range to determine if the device is currently falling. Furthermore, the system and method can reliably detect a non-linear fall, such as when the fall is accompanied with device rotation or initiated by additional external force. To detect a non-linear fall, the processor compares combinations of acceleration measurements to a value range and further determines the smoothness of the acceleration measurement combinations.


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