The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2007

Filed:

May. 21, 2004
Applicants:

Zhengrong Ying, Wakefield, MA (US);

Ram Naidu, Waban, MA (US);

Sergey Simanovsky, Brookline, MA (US);

Carl R. Crawford, Brookline, MA (US);

Inventors:

Zhengrong Ying, Wakefield, MA (US);

Ram Naidu, Waban, MA (US);

Sergey Simanovsky, Brookline, MA (US);

Carl R. Crawford, Brookline, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of and a system for computing Z (effective atomic number) images from projection data are provided, wherein the projections are acquired using at least two x-ray spectra for a set of scanned objects, including a set of low energy projections and a set of high energy projections; the method comprises decomposing the low energy projections and high energy projections into photoelectric projections, reconstructing the photoelectric projections into photoelectric images, reconstructing one of the two sets of projections into CT images, and computing Z images from the CT images and the photoelectric images with parameters obtained from a calibration procedure.


Find Patent Forward Citations

Ying, Zhengrong. (2007). Method of and system for computing effective atomic number images in multi-energy computed tomography (U.S. Patent No. 7190757). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7190757

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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