The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2007
Filed:
Aug. 12, 2004
Applicants:
Kenta Mikuriya, Musashino, JP;
Yasuhiro Tanibata, Musashino, JP;
Hideomi Negishi, Musashino, JP;
Naoki Seki, Musashino, JP;
Yasuhito Kosugi, Musashino, JP;
Inventors:
Kenta Mikuriya, Musashino, JP;
Yasuhiro Tanibata, Musashino, JP;
Hideomi Negishi, Musashino, JP;
Naoki Seki, Musashino, JP;
Yasuhito Kosugi, Musashino, JP;
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides a confocal scanning microscope whereby fluorescence observations can be made using a plurality of types of excitation light without the need for attaching and detaching a light source to and from the optical fiber. The confocal scanning microscope comprises: